23-07: Best Practices for Fabrication of Microelectronic Devices
The NESC has released a technical bulletin for the Avionics community.
Material degradation during the fabrication of microelectronic devices has plagued the space industry for many years owing to the layering of many dissimilar metals to create these devices. Often, commonly used materials and systems are overlooked as potential sources of material degradation. This technical bulletin highlights extensive research to isolate probable causes of this degradation.
Download the full technical bulletin here.
For more information, contact Donald S. Parker, donald.s.parker@nasa.gov
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Meagan Chappell
